State-Saving @ NXP
In Internet of Thing (IoT) applications, energy is often available only sporadically. Since power can be lost at any time, processing larger tasks on a microcontroller requires special measurements to be taken in order to avoid restarting the entire task after a power outage.
In a collaboration with NXP Semiconductor we have developed a state saving mechanism tailored for IoT applications, which reuses the existing scan-chains inserted for testing in order to extract the state of a circuit such that it can be saved to a non-volatile memory.
So far, we have developed and evaluated our approach on a virtual prototyping platform provided by NXP, which is based on an ARM Cortex M3. The next step is now to implement and evaluate our approach on a product-ready chip design: This chip design features an ultra-low power, high performance wireless microcontroller supporting multiple networking stacks to facilitate the development of Home Automation, Smart Energy, Light Link and Remote control applications.
The goal of this Master Thesis is to extend and adapt our state-saving approach such that it can be deployed in a state-of-art commercial IoT SoC. This thesis will be carried out at NXP in Eindhoven, NL.
- Master Thesis
- Supervision: Pascal Alexander Hager (IIS)
- 10% Theory
- 30% Understanding the existing design
- 60% Implementation
- VLSI I