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Revision history of "Experimental Validation of Impact Ionization Models for TCAD Simulation by a Novel Characterization Technique"

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  • (cur | prev) 10:30, 5 June 2019Pocmarco (talk | contribs). . (5,113 bytes) (+5,113). . (Created page with "thumb| ===Introduction=== Modeling and simulation of impact ionization in semiconductors is fundamental to the design and the robu...")