Difference between revisions of "Brunn test"
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Revision as of 17:54, 4 December 2018
Analoog IC Design
- High-Speed Digital-to-Analog Converter (DAC) for massive MIMO testing in 65nm CMOS
- High-Speed SAR ADC for next generation wireless communication in 12nm FinFET
- Analog building blocks for mmWave manipulation
- A mmWave Voltage-Controlled-Oscillator (VCO) for beyond 5G applications
- Bluetooth Low Energy network with optimized data throughput
- 5G Cellular RF Front-end Design in 22nm CMOS Technology
- Design of Charge-Pump PLL in 22nm for 5G communication applications
RF SoCs for the Internet of Things
- High-Speed Digital-to-Analog Converter (DAC) for massive MIMO testing in 65nm CMOS
- High-Speed SAR ADC for next generation wireless communication in 12nm FinFET
- Analog building blocks for mmWave manipulation
- A mmWave Voltage-Controlled-Oscillator (VCO) for beyond 5G applications